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Please use this identifier to cite or link to this item: http://hdl.handle.net/10928/176

Title: Structural and optical properties of reactive-sputtered films of V_2O_5 : Measurement of optical bandgap and roughness correction
Authors: MAKI, Kyohei
FUKUDA, Tomohiro
MOMOSE, Hideyuki
NAKANO, Takeo
BABA, Shigeru
Keywords: Optical transmission spectrum
Surface roughness
Optical band gap
Vanadium pentoxide
Issue Date: 1-Jun-2012
Publisher: 成蹊大学理工学部
Abstract: Films of vanadium oxide were prepared by reactive DC magnetron sputtering. Crystalline films of α-V_2O_5 could be obtained at 500℃ for an hour in oxygen atmosphere. Further annealing made rod-like crystallites to grow, and optical spectra of transmittance and reflectance changed with annealing, but the change after the crystallization could be explained by the increase in the surface roughness and the corrected absorption coefficients yielded a value of 2.25 eV for the bandgap energy.
URI: http://hdl.handle.net/10928/176
Appears in Collections:第49巻第1号

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