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Please use this identifier to cite or link to this item: http://hdl.handle.net/10928/284

Title: SIFT特徴量を用いた顔認証に関する一考察
Other Titles: Studies on the Face Authentication Using SIFT Features
Authors: 稲葉, 俊輔
村上, 仁己
小池, 淳
Inaba, Shunsuke
Murakami, Hitomi
Koike, Atsushi
Keywords: Face authentication
SIFT (Scale Invariant Feature Transform) features
Issue Date: 1-Dec-2012
Publisher: 成蹊大学理工学部
Abstract: There is ID card as the method of personal authentication. This is not necessarily a surefire way in terms of safety, forgery and loss. This is why, biometric authentication using physical features is gathering attention. Face authentication is a part of it. But there are some problems when face image are hidden by masks and sunglasses. In such case, face would not be necessarily succeeded with conventional authentication methods. SIFT(Scale Invariant Feature Transform) is one of the algorithms that describes features of brightness, orientation and size invariant features. We think SIFT features would be able to solve the problem in face authentication as above conditions. Goal of our study is personally identifiable using face image in that some parts, such as eye or nose, are invisible. The purpose of this paper is to examine the possibility of using SIFT features in face authentication.
URI: http://hdl.handle.net/10928/284
Appears in Collections:第49巻第2号

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