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第49巻第2号 >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10928/297

Title: TOF-SIMSによるPEG試料測定における酸化膜の影響
Other Titles: Effect of Oxidized Film on TOF-SIMS Measurement of PEG Samples
Authors: 青柳, 里果
濱村, 忠佑
加藤, 信彦
工藤, 正博
AOYAGI, Satoka
HAMAMURA, Tadasuke
KATO, Nobuhiko
KUDO, Masahiro
Issue Date: 1-Dec-2012
Publisher: 成蹊大学理工学部
URI: http://hdl.handle.net/10928/297
Appears in Collections:第49巻第2号

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